MUT-IOE (Warsaw, Poland)
Research highlights
MUT-IOE
Institute of Optoelectronics (IOE), Military
University of Technology (MUT), Warsaw, Poland
Contact: Henryk Fiedorowicz
High energy physics
Secondary Sources
Development of laser-plasma sources of soft X-rays and extreme ultraviolet (EUV) based on a gas puff target [Phys. Plasmas 27, 073102 (2020); Metrol. Meas. Syst. 27, 701 (2020)]
Plasma Physics
Generation of high-density cold plasmas by phtoionization of gases with intense EUV pulses [Laser Part. Beams 37, 400 (2019); J. Phys. B: At. Mol. Opt. Phys. 53, 045701 (2020)].
Cellular and Molecular Biology
Soft X-ray nanoimaging of cell structures and surface modification of biomaterials with EUV to enhance cell adhesion [Appl. Sci. 10, 6895 (2020); Int. J. Mol. Sci. 21, 9679 (2020)]
Imaging & Diagnostic Techniques
Development of new techniques for nanoimaging and spectroscopy studies [Scientific Reports 8, 8494 (2018); Appl. Phys. B 125, 70 (2019); Radiat. Phys. Chem. 175, 108086 (2020)].
Further application highlights
Expertise
The MUT-IOE laser infrastructure participating in the Laserlab-Europe project is the Laser-Matter Interaction (LMI) team (www.ztl.wat.edu.pl/zoplzm). The LMI team specializes in the development of laser-driven sources of soft X-rays and extreme ultraviolet (EUV) and applications in science and technology. The sources are based on a gas puff target irradiated with nanosecond laser pulses from commercially available Nd:YAG laser systems. The gas puff target approach allows for the emission of soft X-rays and EUV with high efficiency, comparable to that of solid targets, however, without target debris production.
The LMI team has developed several experimental setups and workstations based on laser plasma soft X-ray and EUV sources with a laser-irradiated gas puff target. The setups and workstations have been applied in various fields, including soft X-ray and EUV microscopy and tomography, soft X-ray absorption spectroscopy (NEXAFS and EXAFS), processing materials with EUV photons, soft X-ray and EUV radiation damage, modification of biomaterials, EUV photoionized plasma studies, metrology of soft X-ray and EUV optical elements and detectors, and others. The experimental setups and workstations are available for the external users and joint projects partners.