Single-shot, real-time carrier-envelope phase measurement and tagging based on stereographic above-threshold ionization at short-wave infrared wavelengths
Zhang, Y., P. Kellner, D. Adolph, D. Zille, P. Wustelt, D. Würzler, S. Skruszewicz, M. Möller, A. M. Sayler, and G. G. Paulus
