Nanoscale imaging applications of soft X-ray microscope based on a gas-puff target source

Wachulak, P. W., A. Torrisi, A. Bartnik, L. Wegrzynski, T. Fok, H. Fiedorowicz
J. Phys.: Conf. Ser. 849, 012050
2017
Paper in Proceedings of a Conference/Workshop
https://doi.org/10.1088/1742-6596/849/1/012050
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